You may have to register before you can download all our books and magazines, click the sign up button below to create a free account.
Section 1 addresses the most recent developments in processes at the semiconductor-solution interface include etching, oxidation, passivation, film growth, porous semiconductor formation, electrochemical, photoelectrochemical, electroluminescence and photoluminescence processes, electroanalytical measurements and related topics on both elemental and compound semiconductors. Section 2 addresses the most recent developments in compound semiconductors encompassing advanced devices, materials growth, characterization, processing, device fabrication, reliability, and related topics.
Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers contains a selection of papers presented at PASSIVITY-9, the 9th International Symposium on the Passivation of Metals and Semiconductors and the Properties of Thin Oxide Layers, which was held in Paris, 27 June - 1 July, 2005. One hundred and twelve peer-reviewed manuscripts have been included. The book covers all the fundamental and applied aspects of passivity and provides a relevant and updated view of the advances and new trends in the field. It is structured in ten sections: • Growth, (Nano)structure and Composition of Passive Films • Passivity of Semiconductors • Electronic Properties of Passive Films • Passivity Issues in Biological Systems • Passivity in High-Temperature Water • Mechanical Properties of Passive Films,• Passivity Issues in Stress Corrosion Cracking and Tribocorrosion • Passivity Breakdown and Localized Corrosion • Modeling and Simulation • Surface Modifications and Inhibitors (for Improved Corrosion Resistance and/or Adhesion)
description not available right now.
description not available right now.
description not available right now.
description not available right now.