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A Short History of Circuits and Systems
After an overview of major scientific discoveries of the 18th and 19th centuries, which created electrical science as we know and understand it and led to its useful applications in energy conversion, transmission, manufacturing industry and communications, this Circuits and Systems History book fills a gap in published literature by providing a record of the many outstanding scientists, mathematicians and engineers who laid the foundations of Circuit Theory and Filter Design from the mid-20th Century. Additionally, the book records the history of the IEEE Circuits and Systems Society from its origins as the small Circuit Theory Group of the Institute of Radio Engineers (IRE), which merged w...
Predictive Analytics in Cloud, Fog, and Edge Computing
This book covers the relationship of recent technologies (such as Blockchain, IoT, and 5G) with the cloud computing as well as fog computing, and mobile edge computing. The relationship will not be limited to only architecture proposal, trends, and technical advancements. However, the book also explores the possibility of predictive analytics in cloud computing with respect to Blockchain, IoT, and 5G. The recent advancements in the internet-supported distributed computing i.e. cloud computing, has made it possible to process the bulk amount of data in a parallel and distributed. This has made it a lucrative technology to process the data generated from technologies such as Blockchain, IoT, a...
Intelligence in Chip: Integrated Sensors and Memristive Computing
Intelligence in Chips: Integrated Sensors and Memristive Computing is an authoritative resource that navigates the exciting landscape of in-memory computing, neuromorphic circuits, and memristive technologies. This book curates expert insights from leading researchers like Abu Sebastian, Alex James, Alon Ascoli, Arindam Basu, Cory Merkel, Fernando Corinto, Jason Eshraghian, Rainer Waser, Spiros Nikolaidis, Stephan Menzel, and Vishal Saxena, highlighting some of the important contributions in the field. Through a comprehensive collection of talks, readers will gain deep insights into how memristive neural computing is revolutionizing artificial intelligence. The book covers the latest innovat...
Emerging Technologies for Education
This book constitutes the thoroughly refereed post-workshop proceedings of the Second International Symposium, SETE 2017, held in conjunction with ICWL 2017, Cape Town, South Africa, in September 2017. The 52 full and 13 short papers were carefully reviewed and selected from 123 submissions. This symposium attempts to provide opportunities for the crossfertilization of knowledge and ideas from researchers in diverse fields that make up this interdisciplinary research area.
Human Factors and Ergonomics Toward an Inclusive and Sustainable Future
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Sensors for Everyday Life
This book offers an up-to-date overview of the concepts, modeling, technical and technological details and practical applications of different types of sensors, and discusses the trends of next generation of sensors and systems for environmental and food engineering. This book is aimed at researchers, graduate students, academics and industry professionals working in the field of environmental and food engineering, environmental monitoring, precision agriculture and food quality control.
Electronic Thin-Film Reliability
Thin films are widely used in the electronic device industry. As the trend for miniaturization of electronic devices moves into the nanoscale domain, the reliability of thin films becomes an increasing concern. Building on the author's previous book, Electronic Thin Film Science by Tu, Mayer and Feldman, and based on a graduate course at UCLA given by the author, this new book focuses on reliability science and the processing of thin films. Early chapters address fundamental topics in thin film processes and reliability, including deposition, surface energy and atomic diffusion, before moving onto systematically explain irreversible processes in interconnect and packaging technologies. Describing electromigration, thermomigration and stress migration, with a closing chapter dedicated to failure analysis, the reader will come away with a complete theoretical and practical understanding of electronic thin film reliability. Kept mathematically simple, with real-world examples, this book is ideal for graduate students, researchers and practitioners.
