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National Semiconductor Metrology Program
  • Language: en
  • Pages: 108

National Semiconductor Metrology Program

  • Type: Book
  • -
  • Published: 1996
  • -
  • Publisher: Unknown

description not available right now.

National Semiconductor Metrology Program
  • Language: en
  • Pages: 252

National Semiconductor Metrology Program

  • Type: Book
  • -
  • Published: 1990
  • -
  • Publisher: Unknown

description not available right now.

National Semiconductor Metrology Program
  • Language: en
  • Pages: 120

National Semiconductor Metrology Program

  • Type: Book
  • -
  • Published: 1997
  • -
  • Publisher: Unknown

description not available right now.

National Semiconductor Metrology Program
  • Language: en
  • Pages: 160
Monthly Catalog of United States Government Publications
  • Language: en
  • Pages: 1032

Monthly Catalog of United States Government Publications

  • Type: Book
  • -
  • Published: 1995
  • -
  • Publisher: Unknown

description not available right now.

Monthly Catalogue, United States Public Documents
  • Language: en
  • Pages: 1100

Monthly Catalogue, United States Public Documents

  • Type: Book
  • -
  • Published: 1995
  • -
  • Publisher: Unknown

description not available right now.

Dielectrics for Nanosystems 3: Materials Science, Processing, Reliability, and Manufacturing
  • Language: en
  • Pages: 419

Dielectrics for Nanosystems 3: Materials Science, Processing, Reliability, and Manufacturing

This issue covers papers relating to advanced semiconductor products that are true representatives of nanoelectronics have reached below 100 nm. Depending on the application, the nanosystem may consist of one or more of the following types of functional components: electronic, optical, magnetic, mechanical, biological, chemical, energy sources, and various types of sensing devices. As long as one or more of these functional devices is in 1-100 nm dimensions, the resultant system can be defined as nanosystem. Papers will be in all areas of dielectric issues in nanosystems. In addition to traditional areas of semiconductor processing and packaging of nanoelectronics, emphasis will be placed on areas where multifunctional device integration (through innovation in design, materials, and processing at the device and system levels) will lead to new applications of nanosystems.

Istc/cstic 2009 (cistc)
  • Language: en
  • Pages: 1124

Istc/cstic 2009 (cistc)

ISTC/CSTIC is an annual semiconductor technology conference covering all the aspects of semiconductor technology and manufacturing, including devices, design, lithography, integration, materials, processes, manufacturing as well as emerging semiconductor technologies and silicon material applications. ISTC/CSTIC 2009 was merged by ISTC (International Semiconductor Technology Conference) and CSTIC (China Semiconductor Technology International Conference), the two industry leading technical conferences in China, and consisted of one plenary session and nine technical symposia. This issue of ECS Transactions contains 159 papers from the conference.