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The ten-volume set LNCS 14220, 14221, 14222, 14223, 14224, 14225, 14226, 14227, 14228, and 14229 constitutes the refereed proceedings of the 26th International Conference on Medical Image Computing and Computer-Assisted Intervention, MICCAI 2023, which was held in Vancouver, Canada, in October 2023. The 730 revised full papers presented were carefully reviewed and selected from a total of 2250 submissions. The papers are organized in the following topical sections: Part I: Machine learning with limited supervision and machine learning – transfer learning; Part II: Machine learning – learning strategies; machine learning – explainability, bias, and uncertainty; Part III: Machine learnin...
The eight-volume set LNCS 12901, 12902, 12903, 12904, 12905, 12906, 12907, and 12908 constitutes the refereed proceedings of the 24th International Conference on Medical Image Computing and Computer-Assisted Intervention, MICCAI 2021, held in Strasbourg, France, in September/October 2021.* The 531 revised full papers presented were carefully reviewed and selected from 1630 submissions in a double-blind review process. The papers are organized in the following topical sections: Part I: image segmentation Part II: machine learning - self-supervised learning; machine learning - semi-supervised learning; and machine learning - weakly supervised learning Part III: machine learning - advances in m...
The seven-volume set LNCS 12261, 12262, 12263, 12264, 12265, 12266, and 12267 constitutes the refereed proceedings of the 23rd International Conference on Medical Image Computing and Computer-Assisted Intervention, MICCAI 2020, held in Lima, Peru, in October 2020. The conference was held virtually due to the COVID-19 pandemic. The 542 revised full papers presented were carefully reviewed and selected from 1809 submissions in a double-blind review process. The papers are organized in the following topical sections: Part I: machine learning methodologies Part II: image reconstruction; prediction and diagnosis; cross-domain methods and reconstruction; domain adaptation; machine learning applica...
The six-volume set LNCS 11764, 11765, 11766, 11767, 11768, and 11769 constitutes the refereed proceedings of the 22nd International Conference on Medical Image Computing and Computer-Assisted Intervention, MICCAI 2019, held in Shenzhen, China, in October 2019. The 539 revised full papers presented were carefully reviewed and selected from 1730 submissions in a double-blind review process. The papers are organized in the following topical sections: Part I: optical imaging; endoscopy; microscopy. Part II: image segmentation; image registration; cardiovascular imaging; growth, development, atrophy and progression. Part III: neuroimage reconstruction and synthesis; neuroimage segmentation; diffusion weighted magnetic resonance imaging; functional neuroimaging (fMRI); miscellaneous neuroimaging. Part IV: shape; prediction; detection and localization; machine learning; computer-aided diagnosis; image reconstruction and synthesis. Part V: computer assisted interventions; MIC meets CAI. Part VI: computed tomography; X-ray imaging.
The eight-volume set LNCS 13431, 13432, 13433, 13434, 13435, 13436, 13437, and 13438 constitutes the refereed proceedings of the 25th International Conference on Medical Image Computing and Computer-Assisted Intervention, MICCAI 2022, which was held in Singapore in September 2022. The 574 revised full papers presented were carefully reviewed and selected from 1831 submissions in a double-blind review process. The papers are organized in the following topical sections: Part I: Brain development and atlases; DWI and tractography; functional brain networks; neuroimaging; heart and lung imaging; dermatology; Part II: Computational (integrative) pathology; computational anatomy and physiology; op...
The four-volume set LNCS 11070, 11071, 11072, and 11073 constitutes the refereed proceedings of the 21st International Conference on Medical Image Computing and Computer-Assisted Intervention, MICCAI 2018, held in Granada, Spain, in September 2018. The 373 revised full papers presented were carefully reviewed and selected from 1068 submissions in a double-blind review process. The papers have been organized in the following topical sections: Part I: Image Quality and Artefacts; Image Reconstruction Methods; Machine Learning in Medical Imaging; Statistical Analysis for Medical Imaging; Image Registration Methods. Part II: Optical and Histology Applications: Optical Imaging Applications; Histo...
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With the acceleration of urbanization and aging processes, chronic ocular diseases have become a critical threat to the vision health of the global population . Chronic ocular diseases include a series of disorders and conditions that involve long-term defects in both anterior and posterior segments of the eye, such as cataract, glaucoma, keratoconus (KC), diabetic retinopathy (DR), and age-related macular degeneration (AMD). However, it is still challenging to understand the mechanisms of these diseases and to discover new and reliable biomarkers to identify the diseases and their severities. Moreover, conventional methods in clinical societies are not as effective or efficient as expected, especially in the era of artificial intelligence.
Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.